Dr. György Radnóczi and Andras Szigethy

One of the presenters was the scientist György Zoltán Radnóczi Ph.D., who for the last 20 years has been working as an expert in electron microscopy and sample preparation at the Centre for Energy Research, Budapest, Hungary. Working in continuous cooperation with Technoorg Linda Co. Ltd. he took part in the development of new equipment and methods for sample preparation. Currently, he is working on low-energy cleaning of FIB-cut TEM samples. His other activities include the characterization of nanostructured semiconductor materials, in-situ heating experiments, and education.

Here are the main topics we have covered:

Preparation objectives: Creation of an ultra-thin sample, where the amorphous, undesirable layers are removed while keeping the original structure intact.

Mechanical preparation: For easy handling of the specimen, it may be necessary to cut and polish the material to obtain the desired shape and size before the ion treatment.

Fixing methods: Proper fixing methods facilitate the sample preparation process and ensure optimal sample position during ion treatment.

High-energy ion milling: High-energy ions allow for rapid milling and result in a nearly ready sample within a short time.

Si+SiGe

Low-energy cleaning: The last step of the sample preparation process is a gentle treatment with low-energy ions to remove any damage caused by the high-energy ions and ultimately clean the sample.

Due to the great interest, we made our Q&A section available to everyone.

Take a look and contact us if you have questions and wish to learn more!