The IV7 model of Technoorg ion mills has been designed for extremely rapid preparation of high-quality TEM/XTEM samples with unsurpassed high thinning rate. The design of the instrument enables both rapid milling with the ultra-high-energy noble gas ion source and final polishing and cleaning with the patented low-energy ion gun.
- Multiple ion sources - High milling rates and final polishing capability in one equipment - Extremely large (>100 µm²) TEM transparent areas - Unique retarding field operation - Optional reactive ion milling, liquid nitrogen cooling and ion beam slope cutting
Gentle Mill, model IV8 for final polishing and cleaning.
Gentle Mill, model IV5 for final polishing and cleaning.
Traceable Transmission Electron Microscopy Calibration Sample
Model MS 3
Precise cutting under stereo microscope • Precise • Small • Easy-to-use
Model MH 2
Thermoplastic gluing under stereo microscope • Heat-stabilized • Small • Ideal for thermoplastic gluing
Polisher for TEM & Metallography Model MC 2
• Rugged, corrosion proof construction • Variable speed control for precision polishing • Quick change bayonet mount bowls • Timer for automatic operation • Extremely light load for fragile TEM samples
Custom made mechanical hand tools
Embedding ring for TEM/XTEM sample preparation
SC-1000 SEM Sample Preparation System for high-quality site-specific sample preparation in SEM application
Our new equipment
In this recently developed instrument we implemented a new method for simultaneous measurement of size distribution, concentration, optical absorption and complex refractive index of aerosol particles.these parameters allow to indentify the sources of pollutant aerosol particles that can be a main advantage in environmental protection, health and saftey and the detection of industrial aerosol sources.
Laser Doppler Anemometer – Nano LDA
Our newest equipment
Our new holographic gage-camera can measure complete 3D vector fields of surface deformations with extreme sensitivity (at fractions of the laser light wavelenghth) and simultaneously at every point of the surface – without any contact with the surface itself.
Ion beam workstation for preparing highest quality TEM/FIB samples
Computerized version of the IV4 system.
SC-2000 SEMPrep for high-quality site-specific sample preparation in SEM application