Gentle MillGentle Mill is a dedicated model with a unique design for end-polishing pre-prepared TEM and/or FIB samples. The patented low-energy ion source and the special sample holder help to reach the ultimate quality for any demand.
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Automated operationThe advanced software of Gentle Mill provides full computer control with a detailed graphical interface. All milling parameters can be stored or pre-programmed in an arbitrary number of steps. This fully automated feature of the Gentle Mill allows to produce high-quality samples with minimum user intervention. Automated perforation detection helps to protect the sample against over-milling and makes the preparation safe and easy. |
“The final step ”The excellent performance of the patented ion source offers an effective, but very gentle cleaning capability to improve the quality of the already prepared TEM or FIB sample. This model is suggested for users, who are looking for the best result or have special needs. |
Protective transfer capsuleThe newest feature of Gentle Mill gives the possibility of transferring extremely sensitive samples under vacuum or inert gas environment. The transfer capsule offers efficient protection against oxygen, vapor or other components that may destroy or contaminate the sample surface while carrying. |
Special 3D adaptor for microscopesA special adaptor is available for Gentle Mill which gives you a fast, easy and safe solution for transferring any samples to Hitachi TEMs. Don’t need to waste time and risk the sample while transferring between the preparation device and the microscope, the same 3D sample holder can be used. |
Online monitoring and supportThe Gentle Mill is supplied with a software extension for online technical support, which enables instant error detection and program elimination via the Internet. |
