Ion Beam Preparation

Possibility of surface polishing. The geometrical model of surface topography. Rotating sample. Rocked sample movement. Preferential sputtering. Tools and parts for sample preparation for ion beam thinning. Arrangements of ion milling. Ion beam sample preparation for cross-sectional TEM. Artefacts due to ion beam milling. Sample temperature during ion sputtering. Ion beam slope cutting.

 

Ion Beam preparation

 

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