News
We are thrilled to announce that we have been honored at the
2023 Hungarian Innovation Awards for our new generation ion milling system.
Idén először a Technoorg Linda Kft. elismerést és támogatást kínál olyan kreatív és progresszív szakemberek számára, akik az elektronmikroszkópiához kapcsolódó műszaki és tudományos területen kiemelkedő eredményeket értek el, ideértve a mintapreparálást és az analízist is. Várjuk azok pályázatát, akik kiválóan hozzájárulnak az innovációhoz kutatással, fejlesztéssel és oktatással.
"Nowadays, the possibilities for further development of cutting-edge technologies must be sought in the nanoscale, which decisively determines the arsenal of tools and techniques for examination and intervention." Szigethy András, the CEO of Technoorg Linda, was recently interviewed by the Hungarian Innotéka scientific magazine.
Events
Join us and our local partner, Nanoscience to this unique exhibition.
In June 2022 our UK partner SCIMED took part in The Advanced Materials Show.
Our „Advanced preparation methods for TEM specimens” webinar was held on the 5th of October. We presented methods of high-quality TEM sample preparation consisting of mechanical preparation, ion milling, and FIB lamella post-processing.
Articles
The effect of bath additives on the thermal stability of the microstructure and hardness of nanocrystalline Ni foils processed by electrodeposition was studied. Three samples with a thickness of 20 μm were prepared: one without any additive and two others with saccharin or trisodium citrate additives.
Weak-beam scanning transmission electron microscopy for quantitative dislocation density measurement
To evaluate dislocations induced by neutron irradiation, we developed a weak-beam scanning transmission electron microscopy (WB-STEM) system by installing a novel beam selector, an annular detector, a high-speed CCD camera and an imaging filter in the camera chamber of a spherical aberration-corrected transmission electron microscope.
Focused ion beam (FIB) sample preparation technique in plan-view geometry allows direct correlations of the atomic structure study via transmission electron microscopy with micrometer-scale property mea- surements.
