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For TEM Users

Technoorg offers a complete set of sample preparation tools for electron microscopy from precise sectioning through effective ion milling to high quality end-polishing  - among others - in the field of nanotechnology, materials and semiconductors science.

For SEM Users

Cross-sectional sample preparation by slope cutting with high-energy ion gun; precise site-positioning ; Final polishing and cleaning with low-energy ion gun; damage-free surfaces for EBSD study. Applicable for multilayer systems, semiconductors, high Tc superconductors, composite materials,  diamond films, glasses, etc.

Laser applications


•Monitoring of liquid- and airborn particles for environment management and filtering of health hazards.

•Monitoring of nano particles in industrial processing.

Ion Mills for rapid thinning & cleaning

Ion Mills for end-polishing & cleaning


Ion Mills combined

Calibration standard

Mechanical preparation tools

Ion Mill for slope cutting & surface cleaning - also for EBSD

laser doppler anemometer

dual wavelength optical spectrometer

Stress and deformation measurement

Holographic Residual Stress Camera - 3D-Hdig