Date and place of birth: 1971, Komárno, Slovakia

EDUCATION:

Ph.D. in physics - 2001, Roland Eötvös University, Budapest (Hungary)

M.Sc. in physics - 1994, Charles University, Prague (Czech Republic)

SUMMARY OF RESEARCH ACTIVITY:

Ion mill and scanning electron microscope design:

– design of supervisory and communication circuits for state-of-the-art ion mills
– software design for state-of-the-art ion mills
– nano-tip field emission electron source design for modern scanning electron microscopes
– analysis and evaluation of signal processing circuits in modern scanning electron microscopes

Structure analysis of thin film systems and other solid state materials:

– thin film specimen preparation by physical vapor deposition and sputtering
– thin film specimen preparation by high-temperature successive deposition of component materials
– vacuum and annealing treatments
– low- and high-energy ion beam thinning
– transmission electron microscopy (TEM) based structure analysis
– cross-sectional transmission electron microscopy (XTEM) of thin film systems
– high-resolution transmission electron microscopy (HRTEM) of thin film systems
– qualitative and quantitative energy dispersive X-ray microanalysis (EDX)
– grazing incidence X-ray diffraction (GI-XRD) based structure analysis

Modeling of solid phase reactions in thin film systems:

– phenomenological methods
– computer simulations

MEMBERSHIP:

European Microbeam Analysis Society

EMPLOYMENTS:

Guest Researcher, 2001 – 2004, National Institute of Standards and Technology,
Gaithersburg (Unites States of America),
Precision Engineering Division, Nanoscale Metrology Group

Research Fellow, 1999 – 2001, Technoorg Linda Scientific Development Ltd. Co.,
Budapest (Hungary),
Ion Beam Technology Division

Research Fellow, 1997 – 1998, Research Institute for Technical Physics of the HAS
Budapest (Hungary),
Structure Research Department, Thin Film Physics Group

Ph.D. Student, 1995 – 1997, Research Institute for Technical Physics of the HAS
Budapest (Hungary),
Structure Research Department, Thin Film Physics Group