for high-quality site-specific sample preparation in SEM application
                                                                                                                   

- cross-sectional sample preparation by slope cutting                         
- final polishing and cleaning of traditional SEM and EBSD samples
- high-energy ion gun for rapid ion milling
- low-energy ion gun for gentle surface polishing and cleaning
- automated parameter settings and operation
- sample rotation and oscillation
- site-specific sample preparation with high-precision positioning
- real-time monitoring of the milling process by high-resolution CCD camera and TFT monitor

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