Technoorg is pleased to announce its new product, a sample preparation system for scanning electron microscopes.

The SC-1000 model is equipped both with high- and low-energy ion sources. Rapid slope cutting with the high-energy ion gun followed by gentle surface cleaning with the low-energy ion gun provides cross-sectional SEM samples suitable for semiconductor failure analysis and other analytical purposes. The system also provides an ion milling based solution for improving and cleaning mechanically polished SEM samples and preparation of demage-free surfaces for EBSD technique.

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