Technoorg Linda offers a complete set of sample preparation tools for electron microscopy, developed for the field of nanotechnology, materials and semiconductors science, from precise sectioning and polishing through effective ion milling to high-quality end-polishing. Our devices are developed for full versatility, high accuracy and flexibility, and can be installed in any sample preparation setup. Samples prepared in other top-of-the-art mechanical or high-energy ion milling systems are compatible with our devices at any stage of the sample preparation process.

MICROSAW^TM, MICROHEAT^TM and MICROPOL^TM are small, versatile and precise tools for cutting, gluing and mechanical polishing/dimpling of samples to be studied in the electron microscopes.

The Gentle Mill  series ion polishers are partly or fully computer controlled systems for high-quality final polishing and cleaning of TEM, XTEM,  HRTEM, STEM and FIB samples and surface cleaning of SEM samples of best quality. The latest  model of Gentle Mill, the Gentle Mill 3 is a fully automated machine allowing an easy-to-use, operator independent, fast sample preparation procedure.

IV3–IV4 ion mills are versatile, ultra-high-precision devices, capable of solving the most complex tasks of sample preparation. Designed for investigation of special materials, allowing manual setting of all sample preparation parameters in the widest possible range. Available with liquid nitrogen cooling, reactive ion milling and a full variety of ion sources offering effective thinning and final polishing in one.

Mini low-energy ion gun, a miniaturized ion gun working at extremely low ion energies. Available for high and ultra high vacuum systems. Recommended for special analytical applications.