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Gentle Mill

Eliminates surface damage caused by the high-energy ion beam. Measures the real crystal structure instead of artifacts on TEM or SEM samples, with Technoorg's unique  endpolisher.

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General purpose ion mills - models IV3, IV4

The IV3/IV4 Ion Milling Systems provide a complete ion milling procedure for TEM sample preparation. The Basic configuration contains two independent and controllable  high-energy - TELETWIN - ion guns. The TELETWIN Ion Gun is composed of two Steigerwald type guns, it provides a high density ion or fast atom beam thus the preparation of samples can be performed during a reasonable time even at low angle bombardment. Its Focused High-energy-Ion Gun version allows even higher milling rate. With the application possibility of the low-energy gun the Combined system can also be used for final polishing.

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MicroSaw

The MicroSaw is a small, versatile diamond wheel saw, to be mounted under a standard laboratory microscope. The precision offered by such an optical alignment makes MicroSaw ideal for cutting and sectioning required during the TEM specimen preparation.

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MicroHeat

MICROHEAT is a heat-stabilzed, combined small table with power supply designed for embedding samples and for thermoplastic gluing under stereooptical microscope.

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MicroPol

MicroPol is a compact, electronically controlled, precise mechanical specimen grinder/polisher designed for planar grinding, thinning and polishing of specimens in the fields of nanotechnology, semiconductors and materials science.

                                                                                                                                                                                                                                

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