for high-quality site-specific sample preparation in SEM application
- cross-sectional sample preparation by slope cutting
- final polishing and cleaning of traditional SEM and EBSD samples
- high-energy ion gun for rapid ion milling
- low-energy ion gun for gentle surface polishing and cleaning
- automated parameter settings and operation
- sample rotation and oscillation
- site-specific sample preparation with high-precision positioning
- real-time monitoring of the milling process by high-resolution CCD camera and TFT monitor
Eliminates surface damage caused by the high-energy ion beam. Measures the real crystal structure instead of artifacts on TEM or SEM samples, with Technoorg's unique endpolisher.
The IV3/IV4 Ion Milling Systems provide a complete ion milling procedure for TEM sample preparation. The Basic configuration contains two independent and controllable high-energy - TELETWIN - ion guns. The TELETWIN Ion Gun is composed of two Steigerwald type guns, it provides a high density ion or fast atom beam thus the preparation of samples can be performed during a reasonable time even at low angle bombardment. Its Focused High-energy-Ion Gun version allows even higher milling rate. With the application possibility of the low-energy gun the Combined system can also be used for final polishing.
The MicroSaw is a small, versatile diamond wheel saw, to be mounted under a standard laboratory microscope. The precision offered by such an optical alignment makes MicroSaw ideal for cutting and sectioning required during the TEM specimen preparation.
MICROHEAT is a heat-stabilzed, combined small table with power supply designed for embedding samples and for thermoplastic gluing under stereooptical microscope.
MicroPol is a compact, electronically controlled, precise mechanical specimen grinder/polisher designed for planar grinding, thinning and polishing of specimens in the fields of nanotechnology, semiconductors and materials science.
Eliminates surface damage caused by the high-energy ion beam. Measures the real crystal structure instead of artifacts on TEM or SEM samples, with Technoorg's unique endpolisher.
The IV3/IV4 Ion Milling Systems provide a complete ion milling procedure for TEM sample preparation. The Basic configuration contains two independent and controllable high-energy - TELETWIN - ion guns. The TELETWIN Ion Gun is composed of two Steigerwald type guns, it provides a high density ion or fast atom beam thus the preparation of samples can be performed during a reasonable time even at low angle bombardment. Its Focused High-energy-Ion Gun version allows even higher milling rate. With the application possibility of the low-energy gun the Combined system can also be used for final polishing. 
The MicroSaw is a small, versatile diamond wheel saw, to be mounted under a standard laboratory microscope. The precision offered by such an optical alignment makes MicroSaw ideal for cutting and sectioning required during the TEM specimen preparation.
heat-stabilzed, combined small table with power supply designed for embedding samples and for thermoplastic gluing under stereooptical microscope.
