For TEM Users

Technoorg offers a complete set of sample preparation tools for electron microscopy from precise sectioning through effective ion milling to high quality end-polishing - among others - in the field of nanotechnology, materials science and semiconductors.  

For SEM Users

Cross-sectional sample preparation by slope cutting with high-energy ion gun; precise site-positioning ; Final polishing and cleaning with low-energy ion gun; damage-free surfaces for EBSD study. Applicable for multilayer systems, semiconductors, high Tc superconductors, composite materials,  diamond films, glasses, etc.

Laser applications


•Monitoring of liquid- and airborn particles for environment management and filtering of health hazards.

•Monitoring of nanoparticles in industrial processing.

Stress and deformation measurement

Holographic Residual Stress Camera - 3D-Hdig